101. Recent developments in thin film research : epitaxial growth and nanostructures, electron microscopy, and X-ray diffraction : Proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and Proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
پدیدآورنده : ]G. Ritter ... et al., editors[
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Thin films, Epitaxy, Nanostructure materials, Electron microscopy, X-rays - Diffraction
رده :
TA
418
.
9
.
T45
S94
1997
102. Recent developments in thin film research :epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction : proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
پدیدآورنده : ]G. Ritter ... et al., editors[
کتابخانه: Library of College of Science University of Tehran (Tehran)
موضوع : ، Thin films,، Epitaxy,، Nanostructured materials,، Electron microscopy,Diffraction ، X-rays
رده :
TA
418
.
9
.
T45
S94
1997
103. Recent developments in thin film research: epitaxial growth and nanostructures, electron microscopy, and x-ray diffraction: proceedings of Symposium B on Epitaxial Thin Film Growth and Nanostructures and proceedings of Symposium C on Recent Developments in Electron Microscopy and X-Ray Diffraction of Thin Film Structures of the 1997 ICAM/E-MRS Spring Conference, Strasbourg, France, June 16-20, 1997
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : Congresses ، Thin films,Congresses ، Epitaxy,Congresses ، Nanostructure materials,Congresses ، Electron microscopy,Congresses ، X-rays-- Diffraction
رده :
TA
418
.
9
.
T45
.
S94
1997
104. Reflection electron microscopy and spectroscopy for surface analysis /
پدیدآورنده : Zhong Lin Wang.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Materials-- Microscopy.,Reflection electron microscopy.,Surfaces (Technology)-- Analysis.,Materials-- Microscopy.,Reflection electron microscopy.,Surfaces (Technology)-- Analysis.
رده :
TA417
.
23
.
W36
1996
105. SEM: a users manual for materials science
پدیدآورنده : / By B. Gabriel
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Microscope and microscopy,Electron microscope,Scanning electron microscopes,Structured materials
رده :
TA417
.
23
.
G28
1985
106. Scanning Electron Microscopy and X-Ray Microanalysis /
پدیدآورنده : by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Materials science.,Measurement.,Microscopy.,Physical measurements.,Spectrum analysis.,Biological Microscopy.,Characterization and Evaluation of Materials.,Materials science.,Materials Science.,Measurement Science and Instrumentation.,Measurement.,Microscopy.,Physical measurements.,Spectroscopy and Microscopy.,Spectroscopy.,Spectroscopy/Spectrometry.,Materials science.,Measurement.,Microscopy.,Physical measurements.,Spectrum analysis.
رده :
TA404
.
6
107. Scanning Probe Microscopy
پدیدآورنده :
کتابخانه: Central Library and Documents Center of Mazandaran University (Mazandaran)
موضوع : xA0;. ; Condensed matter. ; Spectroscopy and Microscopy. ; &xA0; &xA0; &Surfaces. ; Thin films. ; Materials science. ; Physical measurements. ; Measurement-Spectroscopy. ; Microscopy. ; Materials
108. Scanning probe microscopy: characterization, nanofabrication and device application of functional materials
پدیدآورنده : edited by Paula Maria Vilarinho, Yossi Rosenwaks and Angus Kingon
کتابخانه: (Semnan)
موضوع : Congresses ، Materials- Microscopy,Congresses ، Scanning probe microscopy
رده :
TA
417
.
23
.
S33
109. Scanning probe microscopy: characterization, nanofabrication and device application of functional materials
پدیدآورنده :
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : Congresses ، Materials-- Microscopy,Congresses ، Scanning probe microscopy
رده :
TA
417
.
23
.
N384
2002
110. Scanning probe microscopy for industrial applications :
پدیدآورنده : edited by Dalia G. Yablon.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Materials-- Microscopy.,Scanning probe microscopy-- Industrial applications.
111. Scanning probe microscopy for industrial applications
پدیدآورنده : / edited by Dalia G. Yablon
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Materials--Microscopy,Scanning probe microscopy--Industrial applications
رده :
TA417
.
23
.
S33
2014
112. Scanning probe microscopy in nanoscience and nanotechnology
پدیدآورنده :
موضوع : ، Scanning probe microscopy.,Microscopy ، Nanostrutured materials
۴ نسخه از این کتاب در ۴ کتابخانه موجود است.
113. Scanning probe microscopy in nanoscience and nanotechnology
پدیدآورنده : / edited by Bharat Bhushan
کتابخانه: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
موضوع : Scanning probe microscopy,Nanostructured materials - Microscopy
رده :
QH212
S33S383
2011
114. Scanning probe microscopy in nanoscience and nanotechnology
پدیدآورنده : / Bharat Bhushan, editor
کتابخانه: University of Tabriz Library, Documentation and Publication Center (East Azarbaijan)
موضوع : Scanning probe microscopy,Nanostructured materials--Microscopy
رده :
QH212
.
S33S383
2010
115. Scanning probe microscopy in nanoscience and nanotechnology
پدیدآورنده : / edited by Bharat Bhushan
کتابخانه: Central Library and Archive Center of shahid Beheshti University (Tehran)
موضوع : Scanning probe microscopy,Nanostructured materials,-- Microscopy
رده :
620
.
11299
S283
2010
116. Scanning transmission electron microscopy of nanomaterials :
پدیدآورنده : editor, Nobuo Tanaka, Nagoya University, Japan.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Nanostructured materials.,Scanning transmission electron microscopy.
117. Scanning transmission electron microscopy of nanomaterials
پدیدآورنده : editor, Nobuo Tanaka.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Nanostructured materials.,Scanning transmission electron microscopy.,Nanostructured materials.,Scanning transmission electron microscopy.
118. Scanning transmission electron microscopy of nanomaterials : basics of imaging and analysis
پدیدآورنده : ]edited by[ Nobuo Tanaka, Nagoya University, Japan
کتابخانه: Library of Razi Metallurgical Research Center (Tehran)
موضوع : ، Scanning transmission electron microscopy,، Nanostructured materials
رده :
QH
212
.
S34
S23
2014
119. Specimen preparation for transmission electron microscopy of materials
پدیدآورنده : Goodhew, Peter J.
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Electron microscopes,Microscopy ، Materials
رده :
TA
417
.
23
.
G66
120. Specimen preparation for transmission electron microscopy of materials III: symposium held December 5-6, 1991, Boston, Mass., U.S.A
پدیدآورنده : editors, Ron Anderson, Bryan Tracy, John Bravman
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : Microscopy Congresses ، Materials,Congresses ، Electron microscopy
رده :
TA
417
.
23
.
S632
